Program - Advanced Materials and Nanoanalysis

9.15-9.30

W e l c o m e   a n d   i n t r o d u c t i o n,
Prof. Jan Dutkiewicz, Institute of Metallurgy and Materials Science of the Polish Academy of Sciences, Cracow, Poland, and Prof. Ehrenfried Zschech, Dresden Fraunhofer Cluster Nanoanalysis, Germany

Atomic resolution studies of materials and interfaces: Transmission electron microscopy

9.30-10.20

Prof. Wolfgang Jaeger, Christian-Albrecht University, Kiel, Germany,
"Transmission Electron Microscopy of Nanoscale Multilayer Materials"

10.20-11.10

Prof. Robert Sinclair, Stanford University, Palo Alto CA, USA,
"Recent Nano-characterization Developments for Functional Materials"

11.40-12.30

Prof. Velimir Radmilovic, University of Belgrade, Belgrade, Serbia,
"Imaging and Spectroscopy of Materials at Atomic Resolution"

12.30-13.20

Dr. Ai Leen Koh, Stanford University, Palo Alto CA, USA, "Bases and Application of Monochromated TEM"

14.20-15.10

Prof. Richard Portier, Universite ENSCP CNRS Paris, France, "New Ti-based Alloys for Medical Application”

15.10-16.00

Prof. James Wittig, Nashville University USA,
“The Influence of Stacking Fault Energy on the Deformation Mechanisms of Austenitic Fe-Mn Steels”

16.30-17.20

Prof. Eva Olsson, Department of Applied Physics, Chalmers University of Technology, Goteborg, Sweden,
"Direct correlation between properties and atomic structure using in situ transmission electron microscopy"

17.20-18.10

Prof. Jerzy Morgiel, Institute of Metallurgy and Materials Science of the Polish Academy of Sciences, Cracow, Poland, “Analytical Electron Microscopy of metallic interlayers deposited with different techniques"

Nanoscale imaging and analysis techniques

9.00-10.00

Prof. Ehrenfried Zschech, Fraunhofer IZFP, Dresden, Germany,
"Nano X-ray Tomography Applications in Materials Science and for 3D Chip Stacking Failure Analysis"

10.00-11.00

Dr. Roland Salzer, Carl Zeiss NTS, Oberkochen. Germany,
"Combined Laser and FIB Cross Sectioning for Time Efficient Target Preparation"

11.30-12.30

Prof. Marek Faryna, Institute of Metallurgy and Materials Science of the Polish Academy of Sciences, Cracow, Poland, "Development of EBSD in nanocrystalline materials; current practice, capabilities and limitations”

12.30-13.30

Dr. Ahmed Shariq, Fraunhofer CNT, Dresden, Germany, "Atom Probe Tomography of Engineering Materials".

14.30-15.30

Prof. Teodor Gotszalk, Politechnika Wroclawska, Poland,
"Nanometrology of electrical properties of nanostructures using scanning probe microscopy methods".

15.30-16.30

Dr. Malgorzata Kopycinska-Mueller, Fraunhofer IZFP, Dresden, Germany,
“AFAM – A new technique for nanoscale determination of elastic properties”

16.30-16.45

C l o s i n g   r e m a r k s

17.00-18.00

1st Meeting of the Materials Characterization Section of the Committee on Materials Science,
Polish Academy of Sciences