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Tilt angles and magnetic rotation angle

Tilt angles ("Tilt X" and "Tilt Y" in “Settings/Microscope settings”) are assumed to be a readout of double tilt holder. They are in degrees. The angles have no influence on the parameters of orientation. The orientation is defined by the diffraction pattern; i.e., it should be provided as the orientation of the crystal with rescpect to the microscope coordinate system. The tilt angles are used in the plane stress case and in dynamic simulation. In the latter case, they are a basis for claculating the actual foil thickness in the direction of microscope optical axis and the vector normal to the foil; the vector is directed from electron entry surface towards the exit surface. Alternatively, instead of tilt angles, the components of that vector can be provided ("Vector normal to foil" in   “Settings/Microscope settings”).  

The angles are defined in such a way that:
v(1) = -Cos(x) * Sin(y)
v(2) = Sin(x)
v(3) = Cos(x) * Cos(y)
where v(i) are components of "Vector normal to foil" in microscope coordinate system, and x and y are values in the  "Tilt X" and "Tilt Y" text fields, rexpectively. 

Once the proper values of tilt angles or the components of the "Vector normal to foil" are entered, click the “Apply” command button.

The angle of magnetic rotation has an influence on the orientation given by Euler angles. The angle should be given in degrees.


TEMStrain v.1.3,   Dec. 2014