LABORATORY OF SPECTRAL CHEMICAL ANALYSIS (L-6)

Authorisation:

Address:

Aleksander Krupkowski Institute

of Metallurgy and Materials Science,

Polish Academy of Sciences,

25, Reymonta Str., 30-59 Kraków,

phone: (48)(12) 295 28 00,

fax: (48)(12) 295 28 04,

e-mail: Adres poczty elektronicznej jest chroniony przed robotami spamującymi. W przeglądarce musi być włączona obsługa JavaScript, żeby go zobaczyć. ,

Head of Laboratory:

Wojciech Maziarz PhD, Eng. ( Adres poczty elektronicznej jest chroniony przed robotami spamującymi. W przeglądarce musi być włączona obsługa JavaScript, żeby go zobaczyć. )

Ewa Bełtowska-Lehman, PhD, DSc.(Deputy Head of Laboratory)

Adam Dębski, MSc, Eng.

The procedures within the scope of accreditation:

Quantitative and qualitative analysis of chemical composition in areas 4 mm in diameter and at depth up to 150 µm using the method of emission spectroscopy (P/19/IB-15 edition 03/25.07.2003

Apparatus: Glow Discharge Spectrometer JY 10 000 RF

Description of the method:
The Glow Discharge Spectrometer JY 10 000 RF is basically used for global quantitative and qualitative chemical analysis of conductive and non-conductive materials. It is also possible to carry out depth profiling and to determine elemental concentration as a function of distance from the surface of metals, semiconductors and ceramics.
The operating scheme of Glow Discharge source is presented in Fig. 1. There are two electrodes in the discharge chamber. A tubular, ground copper anode (4 mm in diameter) faces the sample, which acts as the cathode, maintained at RF potential of 13.56 MHz. The lamp is filled with argon at low pressure. Accelerated ions of Ar assure uniform sputtering of the sample in front of the anode. Then, the atoms of the sample are excited, mainly by collisions with electrons. The resulting plasma produces a spectrum characteristic for the sample composition. This characteristic spectrum is separated on diffraction gratings and its intensities are analysed in photomultipliers installed on the Roland circle (Fig. 2). The intensities of the characteristic spectrum of particular elements are stored on hard disc and can be compared with the intensity of standards.

 

Fig.1. Diagram of RF-lamp operation

One of the important functions of the apparatus is to provide the possibility of performing profile analysis. This method is used to investigate changes of chemical concentration within surface layers (down to over 150 mm) with typical depth resolution of 5 to 10 nm. It is of particular importance for the investigation of layers, surfaces exposed to wearing, functional gradient materials.

Fig. 2. Optical scheme of spectrometer .

Present capabilities of the JY 10000 RF spectrometer

1. Bulk analysis

Quantitative analysis of the chemical composition of homogeneous bulk materials can be performed for 25 elements, accessible in the present configuration of the instrument (Ag, Al, C, Cd, Co, Cr, Cu, Fe, Li, Mg, Mn, N, Nb, Ni, O, P, Si, Sn, Ti, V, Y, Zn, Zr). Chemical composition data are obtained from the 4 mm wide area on the specimen surface (penetration depth: up to 150 mm). The detection of elements depends on their amount in particular materials, ranging from 0.01 up to over a dozen ppm.

2. Depth profiling

The instrument is capable of performing chemical analysis at the surface or at the depth of over 150 microns, with typical depth resolution of 5 to 10 nm. The analysis can be performed simultaneously for 25 elements set up on the polychromators, or additionally for one element set up on the monochromator.

The typical examples:

Depth profile of polyester layers on steel

 

Persons interested in co-operation should contact:

The Head of the Laboratory L-6:

Wojciech Maziarz, PhD, Eng.

phone: (0-12) 295 28 57

e-mail: Adres poczty elektronicznej jest chroniony przed robotami spamującymi. W przeglądarce musi być włączona obsługa JavaScript, żeby go zobaczyć.

orginal