In this month I made ​​the transition of data obtained in EBSD/SEM for the cross-section ND-TD and TD-ND into rolling ED-TD.
The analysis of texture data for the calculated percentage shares texture components defined as:
- C = (11-1) [112] - component 'Copper'
- S = (6-43 [132] - component 'S'
- G = (001) [110] - component 'Goss',
- B = (1-12) [110] - component 'Brass'
I could draw the following conclusions:
- It is possible to obtain the data of percentage shares of texture components on the plane (ED-TD) by performing measurements of local orientation in a plane perpendicular to the direction of ED and transforming it accordingly,
- The data obtained for the 1-hour annealing for increasing temperatures for alloys AA1050 and AA3004 showed no correlation,
- Area taken up to the study was too small to obtain reliable results,
- Verification of the results must always be done based on the measurement by another method.

I went to Mallorca within the ERASMUS exchange scheme where at the University of Balearic Islands I conducted DSC studies of some preselected samples.
I obtained promissing results, which hopefullly will help to compile a new paper studying the effect of atomic order enhancement on martensitic transformation temperature in Ni-Mn based alloys.

This month I took part in the EMAS2013 conference and a course “An Introduction to EPMA: An EMAS Short Course”. They were both held in Porto. During the conference I presented a poster. The course was very useful. It helped me to understand the WDS system which we have installed in the microscope that I barely use. Most of the time during this month I spend preparing for the conference so I did not do much experimental work.

Main studies carried out during this month:

- characterization of new melt spun ribbons: microstructure studies using SEM, phase composition analysis using XRD, DSC, preliminary investigation of thin foils using TEM

- participation in QEM 2013, Saint Aygulf, France

I ran some simulations in the FDTD Solutions. The program was used to test the reflectivity from the silicon surface due to the different surface structures constructed in this program. Also I examined the pits distribition after acidic texturization. Distribution curve which maximum is shifted toward smaller pits size (distribution with a tail) gives the highest reflection reduction.
I was participate on two conferences: IV Symposium Photovoltaics and Transparent Electronics - Perspectives of Developement (second place for the best speech) and EMSR in Strasbourg.